Results for VPA38700-W01604


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Basic Information for VPA38700-W01604


Brief description of DB components associated to this Module and associated tests


Click for packaging sticker
MetadataValue
Alt Identifier VPA38700-W01604
Serial Number 20USBSL0001604
Batch VPA38700
Assembled False
Completed True
Current Location SCIPP, UC Santa Cruz
Manufacture ID VPA38700-W01604
User Shigeki Hirose

Children

Alt IdentifierLocal NameSerial NumberTypeTrashedCompletedTimestamp

Parents

ComponentTypeTimestamp
Sensor Wafer

NameCurrent StageTimestamp

Test NamePassed?Date
Manufacturing Data ATLAS18 2021-09-13T00:00:00.000Z
ATLAS18 Full Strip KEK Test NEW V1 2021-09-13T00:00:00.000Z
ATLAS18 Shape Metrology V1 2021-09-13T21:02:09.000Z
ATLAS18 Approval V1 2022-03-03T09:25:25.664Z
ATLAS18 IV Test V1

Bare IV for VPA38700-W01604


Shown below are results for the Bare IV

SensorIVSvc::CalculateVBD                  INFO                Average voltage 4.940000, current 0.015100, dIdV 0.001947
SensorIVSvc::CalculateVBD                  INFO                V_avg_BD 0.637086 and VBD limit 5.500000
SensorIVSvc::CalculateVBD                  INFO                Calculated VBD to be 0.000000
SensorIVSvc::read                          INFO                RMS current stability 0.000000
IService::UPLOADDB                         INFO                Working on test code ATLAS18_IV_TEST_V1
SensorIVSvc::uploadDB                      INFO                Formatting database upload for ATLAS18_IV_TEST_V1 and run number 1
SensorIVSvc::writeOutput                   INFO                Writing results output file /home/data/output//SensorIV_PreTabIV_PPB_v1//VPA38700-W01604/1//VPA38700-01604_IV_001.dat
SensorIVSvc::getDate                       INFO                Parsing date 2025-10-17T18:42:15.046+00:00...
SensorIVSvc::getDate                       INFO                Year 2025 
SensorIVSvc::getDate                       INFO                Month 10  
SensorIVSvc::getDate                       INFO                Day 17    
SensorIVSvc::getDate                       INFO                Hour 18   
SensorIVSvc::getDate                       INFO                Minute 42 
SensorIVSvc::getDate                       INFO                Second 15 
SensorIVSvc::getDate                       INFO                Offset 0:0
SensorIVSvc::getDate                       INFO                Converted month into string Oct
SensorIVSvc::getDate                       INFO                FINALLY obtained 17 Oct 2025
IService::log                              INFO                Logging status 0111 for component VPA38700-W01604
IService::install                          INFO                Installing output directory to /home/data/modules/VPA38700-W01604/SensorIV_PreTabIV_PPB_v1-1/
IService::install                          INFO                Installed warningLog.txt...
IService::install                          INFO                Installed errorLog.txt...
IService::install                          INFO                Installed infoLog.txt...
IService::install                          INFO                Installed IVCurve.pdf...
IService::install                          INFO                Installed VPA38700-01604_IV_001.dat...
IService::install                          INFO                Installed DB_READY_SENSOR_ATLAS18_IV_TEST_V1.json...
IService::install                          INFO                Installed VPA38700-W01604.root...
IService::install                          INFO                Installed status.json...
MetaData::readField                        INFO                Reading file /home/data/upload//SensorIV_PreTabIV_PPB_v1//VPA38700-W01624-1.config
IService::next                             INFO                Scheduling Data_VPA38700-W01624-1.txt file to run...
IService::next                             INFO                Writing results to /home/data/output//SensorIV_PreTabIV_PPB_v1//VPA38700-W01624/1/
IService::PASSFAIL                         WARNING             Service VPA38700-W01604 has failed criteria!
MetadataValue
Component type ATLAS18LS
Operator LM
Date 2025-10-17T18:42:15.046+00:00
Institute UCSC
Power supply CAEN_DT1415ET
Temperarture [C] 18.8
Humidity 3.4
Current per area @500V 0.064
Breakdown voltage 0.000
Current stability (RMS@700V) 0.000

The current measurements are calibrated to a common temperature using the following relationship: $$I_{temp}^{SF} = \left ( \frac{T_{ref}}{T_{meas}} \right )^{2} \times e^{eE_{g}^{Si} \frac{T_{ref}-T_{meas}}{2 k_{B} T_{ref} T_{meas} }} $$ where \( T_{ref} \) is the reference temperature, \( T_{meas} \) is the temperatured measured during the test, \( e \) is the electric charge, \( E_{g}^{Si} \) is the band gap energy of silicon, and \( k_{B} \) is the Boltzman constant